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Progress in Transmission Electron Microscopy I

Concepts and Techniques, Springer Series in Surface Sciences 38

Zhang, Xiao-Feng / Zhang, /
Erschienen am 01.11.2000, Auflage: 1. Auflage
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Bibliografische Daten
ISBN/EAN: 9783540676805
Sprache: Englisch
Einband: Gebunden

Beschreibung

Inhaltsangabe1 The Modern Microscope Today.- 2 The Quest for Ultra-High Resolution.- 3 Z-Contrast Imaging in the Scanning Transmission Electron Microscope.- 4 Inelastic Scattering in Electron Microscopy-Effects, Spectrometry and Imaging.- 5 Quantitative Analysis of High-Resolution Atomic Images.- 6 Electron Crystallography-Structure determination by combining HREM, Crystallographic image processing and electron diffraction.- 7 Electron Amorphography.- 8 Weak-Beam Electron Microscopy.- 9 Point Group and Space Group Identification by Convergent Beam Electron Diffraction.- 10 Advanced Techniques in TEM Specimen Preparation.